A quantitative analysis of strong-beam α fringes from {110} antiphase boundaries in GaAs

D. René Rasmussen; Stuart McKernan; C. Barry Carter

doi:10.1080/01418619108205584

A quantitative analysis of strong-beam α fringes from {110} antiphase boundaries in GaAs

D. René Rasmussen
, Stuart McKernan
, C. Barry Carter

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The reliability of a quantitative comparison of contrast between experimental and simulated strong-beam transmission electron microscope images depends on an accurate determination of a number of parameters. It is shown that, by recording simultaneous bright-field and dark-field images, the main sources of uncertainty in such an analysis, namely the crystal potential and the absorption parameter, can be reduced substantially. This technique has been employed in order to determine the rigid-body translation across {110} antiphase boundaries in GaAs, by analysis of strong-beam α fringes. © 1991 Taylor & Francis Group, LLC.

Original language	English
Pages (from-to)	1299-1314
Number of pages	16
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	63
Issue number	6
DOIs	https://doi.org/10.1080/01418619108205584
State	Published - Jan 1 1991
Externally published	Yes

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title = "A quantitative analysis of strong-beam α fringes from \{110\} antiphase boundaries in GaAs",

abstract = "The reliability of a quantitative comparison of contrast between experimental and simulated strong-beam transmission electron microscope images depends on an accurate determination of a number of parameters. It is shown that, by recording simultaneous bright-field and dark-field images, the main sources of uncertainty in such an analysis, namely the crystal potential and the absorption parameter, can be reduced substantially. This technique has been employed in order to determine the rigid-body translation across \{110\} antiphase boundaries in GaAs, by analysis of strong-beam α fringes. {\textcopyright} 1991 Taylor \& Francis Group, LLC.",

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AU - Rasmussen, D. René

AU - McKernan, Stuart

AU - Carter, C. Barry

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Y1 - 1991/1/1

N2 - The reliability of a quantitative comparison of contrast between experimental and simulated strong-beam transmission electron microscope images depends on an accurate determination of a number of parameters. It is shown that, by recording simultaneous bright-field and dark-field images, the main sources of uncertainty in such an analysis, namely the crystal potential and the absorption parameter, can be reduced substantially. This technique has been employed in order to determine the rigid-body translation across {110} antiphase boundaries in GaAs, by analysis of strong-beam α fringes. © 1991 Taylor & Francis Group, LLC.

AB - The reliability of a quantitative comparison of contrast between experimental and simulated strong-beam transmission electron microscope images depends on an accurate determination of a number of parameters. It is shown that, by recording simultaneous bright-field and dark-field images, the main sources of uncertainty in such an analysis, namely the crystal potential and the absorption parameter, can be reduced substantially. This technique has been employed in order to determine the rigid-body translation across {110} antiphase boundaries in GaAs, by analysis of strong-beam α fringes. © 1991 Taylor & Francis Group, LLC.

UR - https://www.scopus.com/pages/publications/0026172904

U2 - 10.1080/01418619108205584

DO - 10.1080/01418619108205584

M3 - Article

SN - 0141-8610

VL - 63

SP - 1299

EP - 1314

JO - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

JF - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

IS - 6

ER -

A quantitative analysis of strong-beam α fringes from {110} antiphase boundaries in GaAs

Abstract

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