Abstract
The disordering of All-xGaxAs/GaAs superlattices by ion-implantation has been studied by cross-sectional electron microscopy. It has been found that the superlattice intermixing is extensive only when accompanied by superlattice amorphization or impurity diffusion. Stacking-fault tetrahedra, interstitial dislocation loops and microtwins are the main types of defects observed after implantation and annealing. The defects are stratified and interact with the periodic strain-field of the superlattice. © 1987 SPIE.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Pages | 185-193 |
| Number of pages | 9 |
| Volume | 797 |
| DOIs | |
| State | Published - Apr 22 1987 |
| Externally published | Yes |
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