An investigation of focused ion beam deposition as a microjoining technique

G. A. Knorovsky; J. R. Michael; B. L. Boyce; K. G. Janssens; P. C. Galambos

An investigation of focused ion beam deposition as a microjoining technique

G. A. Knorovsky
, J. R. Michael
, B. L. Boyce
, K. G. Janssens
, P. C. Galambos

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	IMAPS International Conference and Exhibition on Device Packaging - Co-located with the Global Business Council, GBC 2006 Spring Conference
State	Published - Dec 1 2006
Externally published	Yes

Cite this

@inproceedings{f3ae869d368d4ae1b9bbaba6b3579a25,

title = "An investigation of focused ion beam deposition as a microjoining technique",

author = "Knorovsky, \{G. A.\} and Michael, \{J. R.\} and Boyce, \{B. L.\} and Janssens, \{K. G.\} and Galambos, \{P. C.\}",

year = "2006",

month = dec,

day = "1",

language = "English",

booktitle = "IMAPS International Conference and Exhibition on Device Packaging - Co-located with the Global Business Council, GBC 2006 Spring Conference",

}

TY - GEN

T1 - An investigation of focused ion beam deposition as a microjoining technique

AU - Knorovsky, G. A.

AU - Michael, J. R.

AU - Boyce, B. L.

AU - Janssens, K. G.

AU - Galambos, P. C.

PY - 2006/12/1

Y1 - 2006/12/1

UR - https://www.scopus.com/pages/publications/84877079300

M3 - Conference contribution

BT - IMAPS International Conference and Exhibition on Device Packaging - Co-located with the Global Business Council, GBC 2006 Spring Conference

ER -