Abstract
We measure near-field distributions of Mie-type optical modes of silicon nanodisks using apertureless near-field optical microscopy. Excellent agreement with numerical predictions is obtained, further enabling multipole analysis of the observed modes.
| Original language | English |
|---|---|
| Title of host publication | Conference on Lasers and Electro-Optics Europe - Technical Digest |
| Volume | 2014-January |
| State | Published - Jan 1 2014 |
| Externally published | Yes |
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