Application of FIB/SEM/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion

Paul G. Kotula; Mark H. Van Benthem; N. Rob Sorensen

doi:10.1109/SSP.2012.6319791

Application of FIB/SEM/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion

Paul G. Kotula
, Mark H. Van Benthem
, N. Rob Sorensen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Tomographic spectral imaging is a powerful technique for the 3D analysis of materials. The present work describes the application of this technique to the analysis of localized corrosion of a connector pin. Implemented via serial sectioning in a focused ion-beam/scanning electron microscope, electron-excited x-ray spectra were acquired from each voxel in a 3D array. The resultant tomographic spectral image was analyzed in its entirety with Sandia's Automated eXpert Spectral Image Analysis multivariate statistical analysis software. The result of the analysis is a small number of chemical components which describe the 3D phase distribution in the volume of material sampled. © 2012 IEEE.

Original language	English
Title of host publication	2012 IEEE Statistical Signal Processing Workshop, SSP 2012
Pages	672-675
Number of pages	4
DOIs	https://doi.org/10.1109/SSP.2012.6319791
State	Published - Nov 6 2012
Externally published	Yes

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10.1109/SSP.2012.6319791

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title = "Application of FIB/SEM/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion",

abstract = "Tomographic spectral imaging is a powerful technique for the 3D analysis of materials. The present work describes the application of this technique to the analysis of localized corrosion of a connector pin. Implemented via serial sectioning in a focused ion-beam/scanning electron microscope, electron-excited x-ray spectra were acquired from each voxel in a 3D array. The resultant tomographic spectral image was analyzed in its entirety with Sandia's Automated eXpert Spectral Image Analysis multivariate statistical analysis software. The result of the analysis is a small number of chemical components which describe the 3D phase distribution in the volume of material sampled. {\textcopyright} 2012 IEEE.",

author = "Kotula, \{Paul G.\} and \{Van Benthem\}, \{Mark H.\} and Sorensen, \{N. Rob\}",

year = "2012",

month = nov,

day = "6",

doi = "10.1109/SSP.2012.6319791",

language = "English",

isbn = "9781467301831",

pages = "672--675",

booktitle = "2012 IEEE Statistical Signal Processing Workshop, SSP 2012",

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TY - GEN

T1 - Application of FIB/SEM/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion

AU - Kotula, Paul G.

AU - Van Benthem, Mark H.

AU - Sorensen, N. Rob

PY - 2012/11/6

Y1 - 2012/11/6

N2 - Tomographic spectral imaging is a powerful technique for the 3D analysis of materials. The present work describes the application of this technique to the analysis of localized corrosion of a connector pin. Implemented via serial sectioning in a focused ion-beam/scanning electron microscope, electron-excited x-ray spectra were acquired from each voxel in a 3D array. The resultant tomographic spectral image was analyzed in its entirety with Sandia's Automated eXpert Spectral Image Analysis multivariate statistical analysis software. The result of the analysis is a small number of chemical components which describe the 3D phase distribution in the volume of material sampled. © 2012 IEEE.

AB - Tomographic spectral imaging is a powerful technique for the 3D analysis of materials. The present work describes the application of this technique to the analysis of localized corrosion of a connector pin. Implemented via serial sectioning in a focused ion-beam/scanning electron microscope, electron-excited x-ray spectra were acquired from each voxel in a 3D array. The resultant tomographic spectral image was analyzed in its entirety with Sandia's Automated eXpert Spectral Image Analysis multivariate statistical analysis software. The result of the analysis is a small number of chemical components which describe the 3D phase distribution in the volume of material sampled. © 2012 IEEE.

UR - https://www.scopus.com/pages/publications/84868222982

U2 - 10.1109/SSP.2012.6319791

DO - 10.1109/SSP.2012.6319791

M3 - Conference contribution

SN - 9781467301831

SP - 672

EP - 675

BT - 2012 IEEE Statistical Signal Processing Workshop, SSP 2012

ER -

Application of FIB/SEM/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion

Abstract

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