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Atomic precision advanced manufacturing for digital electronics

  • Daniel R. Ward
  • , Scott W. Schmucker
  • , Evan M. Anderson
  • , Ezra Bussmann
  • , Lisa Tracy
  • , Tzu Ming Lu
  • , Leon N. Maurer
  • , Andrew Baczewski
  • , Deanna M. Campbell
  • , Michael T. Marshall
  • , Shashank Misra

Research output: Contribution to journal › Article › peer-review

32 Scopus citations
Original languageEnglish
Pages (from-to)4-10
Number of pages7
JournalElectronic Device Failure Analysis
Volume22
Issue number1
StatePublished - Feb 1 2020
Externally publishedYes

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