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Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy

  • Ping Lu
  • , Jie Xiong
  • , Mark Van Benthem
  • , Quanxi Jia

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

Atomic-scale quantification of chemical composition across oxide interfaces is important for understanding physical properties of epitaxial oxide nanostructures. Energy-dispersive X-ray spectroscopy (EDS) in an aberration-corrected scanning transmission electron microscope was used to quantify chemical composition across the interface of ferromagnetic La 0.7Sr0.3MnO3 and antiferromagnetic BiFeO 3 quantum structure. This research demonstrates that chemical composition at atomic columns can be quantified by Gaussian peak-fitting of EDS compositional profiles across the interface. Cation diffusion was observed at both A- and B-sublattice sites; and asymmetric chemical profiles exist across the interface, consistent with the previous studies. © 2013 AIP Publishing LLC.
Original languageEnglish
JournalApplied Physics Letters
Volume102
Issue number17
DOIs
StatePublished - Apr 29 2013
Externally publishedYes

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