Characterization of nanoparticle films and structures using focused ion beam milling and transmission electron microscopy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Original language	English
Title of host publication	Microscopy and Microanalysis
Pages	1144-1145
Number of pages	2
Volume	8
Edition	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927602103795
State	Published - Jan 1 2002
Externally published	Yes

Access to Document

@inproceedings{b3395a2494e04cc69669d7321a3da798,

title = "Characterization of nanoparticle films and structures using focused ion beam milling and transmission electron microscopy",

author = "Perrey, \{Christopher R.\} and Carter, \{C. Barry\} and Kotula, \{Paul G.\} and Michael, \{Joseph R.\}",

year = "2002",

month = jan,

day = "1",

doi = "10.1017/s1431927602103795",

language = "English",

volume = "8",

pages = "1144--1145",

booktitle = "Microscopy and Microanalysis",

edition = "SUPPL. 2",

}

TY - GEN

T1 - Characterization of nanoparticle films and structures using focused ion beam milling and transmission electron microscopy

AU - Perrey, Christopher R.

AU - Carter, C. Barry

AU - Kotula, Paul G.

AU - Michael, Joseph R.

PY - 2002/1/1

Y1 - 2002/1/1

UR - https://www.scopus.com/pages/publications/0036413544

U2 - 10.1017/s1431927602103795

DO - 10.1017/s1431927602103795

M3 - Conference contribution

VL - 8

SP - 1144

EP - 1145

BT - Microscopy and Microanalysis

ER -