Complementary microscopy techniques for characterizing nanostructures

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Microscopy and Microanalysis
Pages	374-375
Number of pages	2
Volume	14
Edition	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608086753
State	Published - Aug 1 2008
Externally published	Yes

Access to Document

@inproceedings{3326d61340514d93be52a530a4e2e889,

title = "Complementary microscopy techniques for characterizing nanostructures",

author = "J. Basu and R. Divakar and N. Ravishankar and Carter, \{C. B.\}",

year = "2008",

month = aug,

day = "1",

doi = "10.1017/S1431927608086753",

language = "English",

volume = "14",

pages = "374--375",

booktitle = "Microscopy and Microanalysis",

edition = "SUPPL. 2",

}

TY - GEN

T1 - Complementary microscopy techniques for characterizing nanostructures

AU - Basu, J.

AU - Divakar, R.

AU - Ravishankar, N.

AU - Carter, C. B.

PY - 2008/8/1

Y1 - 2008/8/1

UR - https://www.scopus.com/pages/publications/49549118681

U2 - 10.1017/S1431927608086753

DO - 10.1017/S1431927608086753

M3 - Conference contribution

VL - 14

SP - 374

EP - 375

BT - Microscopy and Microanalysis

ER -