Compositional mapping by X-ray spectrum imaging at 1 MHz output count rate with the silicon drift detector

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Original language	English
Title of host publication	Microscopy and Microanalysis
Pages	1164-1165
Number of pages	2
Volume	14
Edition	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608081816
State	Published - Aug 1 2008
Externally published	Yes

Access to Document

@inproceedings{f1524168f2494e2080e5b6f335c8b4c8,

title = "Compositional mapping by X-ray spectrum imaging at 1 MHz output count rate with the silicon drift detector",

author = "D. Newbury and J. Davis and D. Bright and N. Ritchie and J. Michael and P. Kotula",

year = "2008",

month = aug,

day = "1",

doi = "10.1017/S1431927608081816",

language = "English",

volume = "14",

pages = "1164--1165",

booktitle = "Microscopy and Microanalysis",

edition = "SUPPL. 2",

}

TY - GEN

T1 - Compositional mapping by X-ray spectrum imaging at 1 MHz output count rate with the silicon drift detector

AU - Newbury, D.

AU - Davis, J.

AU - Bright, D.

AU - Ritchie, N.

AU - Michael, J.

AU - Kotula, P.

PY - 2008/8/1

Y1 - 2008/8/1

UR - https://www.scopus.com/pages/publications/49549097144

U2 - 10.1017/S1431927608081816

DO - 10.1017/S1431927608081816

M3 - Conference contribution

VL - 14

SP - 1164

EP - 1165

BT - Microscopy and Microanalysis

ER -