Abstract
We have demonstrated the ability to control the microstructure of PETN films deposited using physical vapor deposition by altering the interface between the film and substrate. Evolution of surface morphology, average density, and surface roughness with film thickness were characterized using surface profilometry and scanning electron microscopy. While films on all of the substrates investigated showed a trend toward a lower average density with increasing film thickness, there were significant variations in density, pore size, and surface morphology in films deposited on different substrates.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 14th International Detonation Symposium, IDS 2010 |
| Pages | 1353-1361 |
| Number of pages | 9 |
| State | Published - Dec 1 2010 |
| Externally published | Yes |
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