Critical thickness measurements in vapor-deposited Pentaerythritol tetranitrate (PETN) films

Alexander S. Tappan; Robert Knepper; Ryan R. Wixom; Jill C. Miller; Michael P. Marquez; J. Patrick Ball

Critical thickness measurements in vapor-deposited Pentaerythritol tetranitrate (PETN) films

Alexander S. Tappan
, Robert Knepper
, Ryan R. Wixom
, Jill C. Miller
, Michael P. Marquez
, J. Patrick Ball

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

23 Scopus citations

Original language	English
Title of host publication	Proceedings - 14th International Detonation Symposium, IDS 2010
Pages	1087-1095
Number of pages	9
State	Published - Dec 1 2010
Externally published	Yes

Cite this

@inproceedings{5962e08dc158426980ab72d606d271b3,

title = "Critical thickness measurements in vapor-deposited Pentaerythritol tetranitrate (PETN) films",

author = "Tappan, \{Alexander S.\} and Robert Knepper and Wixom, \{Ryan R.\} and Miller, \{Jill C.\} and Marquez, \{Michael P.\} and Ball, \{J. Patrick\}",

year = "2010",

month = dec,

day = "1",

language = "English",

pages = "1087--1095",

booktitle = "Proceedings - 14th International Detonation Symposium, IDS 2010",

}

TY - GEN

T1 - Critical thickness measurements in vapor-deposited Pentaerythritol tetranitrate (PETN) films

AU - Tappan, Alexander S.

AU - Knepper, Robert

AU - Wixom, Ryan R.

AU - Miller, Jill C.

AU - Marquez, Michael P.

AU - Ball, J. Patrick

PY - 2010/12/1

Y1 - 2010/12/1

UR - https://www.scopus.com/pages/publications/84883413323

M3 - Conference contribution

SP - 1087

EP - 1095

BT - Proceedings - 14th International Detonation Symposium, IDS 2010

ER -