| Original language | English |
|---|---|
| Title of host publication | Proceedings - Electron Microscopy Society of America |
| Pages | 442-445 |
| Number of pages | 4 |
| State | Published - Dec 1 1982 |
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DEFECTS IN HEAVILY-DOPED MBE GaAs.
- C. B. Carter
- , D. M. DeSimone
- , T. Griem
- , C. E.C. Wood
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution