Abstract
Impurities, such as vanadium, degrade the operating performance of yttria‐stabilized zirconia thermal‐barrier coatings. V2O5 reacts preferentially with Y2O3, forms YVO4, and leads to the destabilization of zirconia thermal‐barrier material. A model experiment has been designed to monitor the destabilization of zirconia thermal barriers by directly exposing thin films of yttria‐stabilized zirconia to V2O5 vapor. The growth of YVO4 from yttria‐stabilized zirconia and the destabilization of cubic yttria‐stabilized zirconia into tetragonal and/or monoclinic zirconia polymorphs are monitored by selected‐area diffraction and energy‐dispersive X‐ray spectroscopy in the transmission electron microscope. A special crystallographic orientation relation between YVO4 and cubic zirconia is discussed. Copyright © 1988, Wiley Blackwell. All rights reserved
| Original language | English |
|---|---|
| Pages (from-to) | 992-1004 |
| Number of pages | 13 |
| Journal | Journal of the American Ceramic Society |
| Volume | 71 |
| Issue number | 11 |
| DOIs | |
| State | Published - Jan 1 1988 |
| Externally published | Yes |
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