Determination of the lattice translation across antiphase boundaries

D. René Rasmussen; Nam Hee Cho; David W. Susnitzky; C. Barry Carter

doi:10.1016/0304-3991(89)90169-1

Determination of the lattice translation across antiphase boundaries

D. René Rasmussen
, Nam Hee Cho
, David W. Susnitzky
, C. Barry Carter

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

This paper describes a method for quantitative comparisons of electron microscope bright-field images with computer-simulated images. The applicability of the technique is demonstrated by preliminary investigations of the rigid-body lattice translation across antiphase boundaries in GaAs and β-SiC. © 1989.

Original language	English
Pages (from-to)	27-32
Number of pages	6
Journal	Ultramicroscopy
Volume	30
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-3991(89)90169-1
State	Published - Jan 1 1989
Externally published	Yes

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title = "Determination of the lattice translation across antiphase boundaries",

abstract = "This paper describes a method for quantitative comparisons of electron microscope bright-field images with computer-simulated images. The applicability of the technique is demonstrated by preliminary investigations of the rigid-body lattice translation across antiphase boundaries in GaAs and β-SiC. {\textcopyright} 1989.",

author = "Rasmussen, \{D. Ren{\'e}\} and Cho, \{Nam Hee\} and Susnitzky, \{David W.\} and Carter, \{C. Barry\}",

year = "1989",

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doi = "10.1016/0304-3991(89)90169-1",

language = "English",

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T1 - Determination of the lattice translation across antiphase boundaries

AU - Rasmussen, D. René

AU - Cho, Nam Hee

AU - Susnitzky, David W.

AU - Carter, C. Barry

PY - 1989/1/1

Y1 - 1989/1/1

N2 - This paper describes a method for quantitative comparisons of electron microscope bright-field images with computer-simulated images. The applicability of the technique is demonstrated by preliminary investigations of the rigid-body lattice translation across antiphase boundaries in GaAs and β-SiC. © 1989.

AB - This paper describes a method for quantitative comparisons of electron microscope bright-field images with computer-simulated images. The applicability of the technique is demonstrated by preliminary investigations of the rigid-body lattice translation across antiphase boundaries in GaAs and β-SiC. © 1989.

UR - https://www.scopus.com/pages/publications/0024680144

U2 - 10.1016/0304-3991(89)90169-1

DO - 10.1016/0304-3991(89)90169-1

M3 - Article

SN - 0304-3991

VL - 30

SP - 27

EP - 32

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-2

ER -

Determination of the lattice translation across antiphase boundaries

Abstract

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