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Effect of high H2 pressure on the structural and the electrical properties of MoS2

  • Hyun Seok Jang
  • , Tae Hyung Kim
  • , Tae Hyun Kim
  • , Jae Sung Lee
  • , Ji Ho Sin
  • , Byung Hoon Kim

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

This study found that the sulfur vacancy (Vs) of MoS2 created by high H2 pressure up to 80 bar affects the structure and the electrical transport property. The charge transport behavior of MoS2 was obtained from in-situ measurements as the H2 pressure was increased from vacuum to 80 bar. After exposure to high H2 pressure, Raman spectroscopy and atomic force microscopy provide information on the structural modulation of MoS2. The conductance of MoS2 increased with increasing H2 pressure and showed irreversibility after the application of a high vacuum (~ 10–5 Torr) at 343 K. The creation of defects (sulfur vacancies) resulting in a min-gap state can explain the conductance change.
Original languageEnglish
Pages (from-to)38-43
Number of pages6
JournalJournal of the Korean Physical Society
Volume79
Issue number1
DOIs
StatePublished - Jul 2021
Externally publishedYes

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