Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

J. G. Park; S. H. Lee; B. Kim; Y. W. Park

doi:10.1063/1.1528281

Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

J. G. Park
, S. H. Lee
, B. Kim
, Y. W. Park

Research output: Contribution to journal › Article › peer-review

90 Scopus citations

Abstract

Electrical resistivity of polypyrrole nanotube was measured by conductive scanning probe microscope. Polypyrrole (PPy) nanotubes were synthesized using the pores of track-etched polycarbonate membrane as template. Its size depended on the pore diameter of template which range from 50 to 200 nm. Linear current-voltage characteristics showed that the resistance was decreased as the contact force was increased.

Original language	English
Pages (from-to)	4625-4627
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	24
DOIs	https://doi.org/10.1063/1.1528281
State	Published - Dec 9 2002
Externally published	Yes

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10.1063/1.1528281

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@article{4d87ce2eceaa44ecb430b759ca323d83,

title = "Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force",

abstract = "Electrical resistivity of polypyrrole nanotube was measured by conductive scanning probe microscope. Polypyrrole (PPy) nanotubes were synthesized using the pores of track-etched polycarbonate membrane as template. Its size depended on the pore diameter of template which range from 50 to 200 nm. Linear current-voltage characteristics showed that the resistance was decreased as the contact force was increased.",

author = "Park, \{J. G.\} and Lee, \{S. H.\} and B. Kim and Park, \{Y. W.\}",

year = "2002",

month = dec,

day = "9",

doi = "10.1063/1.1528281",

language = "English",

volume = "81",

pages = "4625--4627",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "24",

}

TY - JOUR

T1 - Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

AU - Park, J. G.

AU - Lee, S. H.

AU - Kim, B.

AU - Park, Y. W.

PY - 2002/12/9

Y1 - 2002/12/9

N2 - Electrical resistivity of polypyrrole nanotube was measured by conductive scanning probe microscope. Polypyrrole (PPy) nanotubes were synthesized using the pores of track-etched polycarbonate membrane as template. Its size depended on the pore diameter of template which range from 50 to 200 nm. Linear current-voltage characteristics showed that the resistance was decreased as the contact force was increased.

AB - Electrical resistivity of polypyrrole nanotube was measured by conductive scanning probe microscope. Polypyrrole (PPy) nanotubes were synthesized using the pores of track-etched polycarbonate membrane as template. Its size depended on the pore diameter of template which range from 50 to 200 nm. Linear current-voltage characteristics showed that the resistance was decreased as the contact force was increased.

UR - https://www.scopus.com/pages/publications/0037049578

U2 - 10.1063/1.1528281

DO - 10.1063/1.1528281

M3 - Article

SN - 0003-6951

VL - 81

SP - 4625

EP - 4627

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

ER -

Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

Abstract

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