Electrical transport measurement of molecular device fabricated by electrochemical deposition of platinum electrode

B. Kim; S. J. Ahn; J. G. Park; S. H. Lee; Y. W. Park; E. E.B. Campbell

doi:10.1016/j.tsf.2005.06.072

Electrical transport measurement of molecular device fabricated by electrochemical deposition of platinum electrode

B. Kim
, S. J. Ahn
, J. G. Park
, S. H. Lee
, Y. W. Park
, E. E.B. Campbell

Research output: Contribution to journal › Conference article

7 Scopus citations

Abstract

Electrical properties of 1,4-benzenedimethanethiol are measured using the electrochemically deposited platinum electrode as one of contact lead to the molecule. Temperature dependence of current-voltage characteristics were measured from room temperature to 27 K. Fowler-Nordheim type tunneling conduction below 40 K and current fluctuation at low temperature were observed. The fluctuating behavior can be understood as electromigration and/or thermal vibration of platinum atoms at the contact between the molecule and the platinum electrode. © 2005 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	196-200
Number of pages	5
Journal	Thin Solid Films
Volume	499
Issue number	1-2
DOIs	https://doi.org/10.1016/j.tsf.2005.06.072
State	Published - Mar 21 2006
Externally published	Yes

Access to Document

10.1016/j.tsf.2005.06.072

Cite this

@article{4bebae9758c845ef89ca591b5a8cf0b2,

title = "Electrical transport measurement of molecular device fabricated by electrochemical deposition of platinum electrode",

abstract = "Electrical properties of 1,4-benzenedimethanethiol are measured using the electrochemically deposited platinum electrode as one of contact lead to the molecule. Temperature dependence of current-voltage characteristics were measured from room temperature to 27 K. Fowler-Nordheim type tunneling conduction below 40 K and current fluctuation at low temperature were observed. The fluctuating behavior can be understood as electromigration and/or thermal vibration of platinum atoms at the contact between the molecule and the platinum electrode. {\textcopyright} 2005 Elsevier B.V. All rights reserved.",

author = "B. Kim and Ahn, \{S. J.\} and Park, \{J. G.\} and Lee, \{S. H.\} and Park, \{Y. W.\} and Campbell, \{E. E.B.\}",

year = "2006",

month = mar,

day = "21",

doi = "10.1016/j.tsf.2005.06.072",

language = "English",

volume = "499",

pages = "196--200",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - Electrical transport measurement of molecular device fabricated by electrochemical deposition of platinum electrode

AU - Kim, B.

AU - Ahn, S. J.

AU - Park, J. G.

AU - Lee, S. H.

AU - Park, Y. W.

AU - Campbell, E. E.B.

PY - 2006/3/21

Y1 - 2006/3/21

N2 - Electrical properties of 1,4-benzenedimethanethiol are measured using the electrochemically deposited platinum electrode as one of contact lead to the molecule. Temperature dependence of current-voltage characteristics were measured from room temperature to 27 K. Fowler-Nordheim type tunneling conduction below 40 K and current fluctuation at low temperature were observed. The fluctuating behavior can be understood as electromigration and/or thermal vibration of platinum atoms at the contact between the molecule and the platinum electrode. © 2005 Elsevier B.V. All rights reserved.

AB - Electrical properties of 1,4-benzenedimethanethiol are measured using the electrochemically deposited platinum electrode as one of contact lead to the molecule. Temperature dependence of current-voltage characteristics were measured from room temperature to 27 K. Fowler-Nordheim type tunneling conduction below 40 K and current fluctuation at low temperature were observed. The fluctuating behavior can be understood as electromigration and/or thermal vibration of platinum atoms at the contact between the molecule and the platinum electrode. © 2005 Elsevier B.V. All rights reserved.

UR - https://www.scopus.com/pages/publications/31544453065

U2 - 10.1016/j.tsf.2005.06.072

DO - 10.1016/j.tsf.2005.06.072

M3 - Conference article

SN - 0040-6090

VL - 499

SP - 196

EP - 200

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Electrical transport measurement of molecular device fabricated by electrochemical deposition of platinum electrode

Abstract

Access to Document

Fingerprint

Cite this