Abstract
We demonstrate a new electro-optic sampling system for the measurements of fast electrical waveforms at gigahertz repetition rates. The system uses a mode-locked InGaAsP injection laser as a source of sampling pulses and employs the electro-optic effect in the GaAs substrate of a microstrip line.
| Original language | English |
|---|---|
| Pages (from-to) | 61-62 |
| Number of pages | 2 |
| Journal | Electronics Letters |
| Volume | 22 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jan 1 1986 |
| Externally published | Yes |
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