Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al<inf>2</inf>O<inf>3</inf>

C. B. CARTER; D. L. KOHLSTEDT; S. L. SASS

doi:10.1111/j.1151-2916.1980.tb09848.x

Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al<inf>2</inf>O<inf>3</inf>

C. B. CARTER
, D. L. KOHLSTEDT
, S. L. SASS

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al2O3. Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface. Copyright © 1980, Wiley Blackwell. All rights reserved

Original language	English
Pages (from-to)	623-627
Number of pages	5
Journal	Journal of the American Ceramic Society
Volume	63
Issue number	11-12
DOIs	https://doi.org/10.1111/j.1151-2916.1980.tb09848.x
State	Published - Jan 1 1980
Externally published	Yes

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title = "Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al2O3",

abstract = "Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al2O3. Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface. Copyright {\textcopyright} 1980, Wiley Blackwell. All rights reserved",

author = "CARTER, \{C. B.\} and KOHLSTEDT, \{D. L.\} and SASS, \{S. L.\}",

year = "1980",

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TY - JOUR

T1 - Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al2O3

AU - CARTER, C. B.

AU - KOHLSTEDT, D. L.

AU - SASS, S. L.

PY - 1980/1/1

Y1 - 1980/1/1

N2 - Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al2O3. Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface. Copyright © 1980, Wiley Blackwell. All rights reserved

AB - Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al2O3. Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface. Copyright © 1980, Wiley Blackwell. All rights reserved

UR - https://www.scopus.com/pages/publications/0019086631

U2 - 10.1111/j.1151-2916.1980.tb09848.x

DO - 10.1111/j.1151-2916.1980.tb09848.x

M3 - Article

SN - 0002-7820

VL - 63

SP - 623

EP - 627

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

IS - 11-12

ER -

Electron Diffraction and Microscopy Studies of the Structure of Grain Boundaries in Al<inf>2</inf>O<inf>3</inf>

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