Electron diffraction study of thin cobalt oxide films grown by pulsed laser deposition on zirconia substrates

Stuart McKernan; Sundar Ramamurthy; C. Barry Carter

Electron diffraction study of thin cobalt oxide films grown by pulsed laser deposition on zirconia substrates

Stuart McKernan
, Sundar Ramamurthy
, C. Barry Carter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

An investigation of cobalt oxide ceramic films grown on zirconia substrates by PLD is presented in this paper. Electron diffraction was used to characterize orientation relations between CoO and zirconia. It was observed that some grains show misorientation and boundaries between grains are inclined to the growth direction resulting to stacking-fault-like fringes.

Original language	English
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Pages	926-927
Number of pages	2
State	Published - Dec 1 1993
Externally published	Yes

Cite this

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title = "Electron diffraction study of thin cobalt oxide films grown by pulsed laser deposition on zirconia substrates",

abstract = "An investigation of cobalt oxide ceramic films grown on zirconia substrates by PLD is presented in this paper. Electron diffraction was used to characterize orientation relations between CoO and zirconia. It was observed that some grains show misorientation and boundaries between grains are inclined to the growth direction resulting to stacking-fault-like fringes.",

author = "Stuart McKernan and Sundar Ramamurthy and Carter, \{C. Barry\}",

year = "1993",

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language = "English",

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T1 - Electron diffraction study of thin cobalt oxide films grown by pulsed laser deposition on zirconia substrates

AU - McKernan, Stuart

AU - Ramamurthy, Sundar

AU - Carter, C. Barry

PY - 1993/12/1

Y1 - 1993/12/1

N2 - An investigation of cobalt oxide ceramic films grown on zirconia substrates by PLD is presented in this paper. Electron diffraction was used to characterize orientation relations between CoO and zirconia. It was observed that some grains show misorientation and boundaries between grains are inclined to the growth direction resulting to stacking-fault-like fringes.

AB - An investigation of cobalt oxide ceramic films grown on zirconia substrates by PLD is presented in this paper. Electron diffraction was used to characterize orientation relations between CoO and zirconia. It was observed that some grains show misorientation and boundaries between grains are inclined to the growth direction resulting to stacking-fault-like fringes.

UR - https://www.scopus.com/pages/publications/0027708777

M3 - Conference contribution

SP - 926

EP - 927

BT - Proceedings - Annual Meeting, Microscopy Society of America

ER -

Electron diffraction study of thin cobalt oxide films grown by pulsed laser deposition on zirconia substrates

Abstract

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