Electron microscopy analysis of interfaces in oxides for energy applications

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1444-1445
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S143192760909357X
State	Published - Jul 1 2009
Externally published	Yes

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title = "Electron microscopy analysis of interfaces in oxides for energy applications",

author = "Winterstein, \{Jonathan P.\} and Chenchen Wang and Carter, \{C. Barry\}",

year = "2009",

month = jul,

day = "1",

doi = "10.1017/S143192760909357X",

language = "English",

volume = "15",

pages = "1444--1445",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Electron microscopy analysis of interfaces in oxides for energy applications

AU - Winterstein, Jonathan P.

AU - Wang, Chenchen

AU - Carter, C. Barry

PY - 2009/7/1

Y1 - 2009/7/1

UR - https://www.scopus.com/pages/publications/69949116300

U2 - 10.1017/S143192760909357X

DO - 10.1017/S143192760909357X

M3 - Article

SN - 1431-9276

VL - 15

SP - 1444

EP - 1445

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -