Abstract
Transmission electron microscopy (TEM) provides a powerful method for understanding microstructure-processing-property relationships. A review of the role and future challenges of TEM in the study of ceramic superconductors is reported in this paper.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Pages | 934-935 |
| Number of pages | 2 |
| State | Published - Dec 1 1993 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Electron microscopy of ceramic superconductors'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver