Emissivity measurements of 3D photonic crystals at high temperatures

T. S. Luk; T. Mclellan; G. Subramania; J. C. Verley; I. El-Kady

doi:10.1016/j.photonics.2007.10.002

Emissivity measurements of 3D photonic crystals at high temperatures

T. S. Luk
, T. Mclellan
, G. Subramania
, J. C. Verley
, I. El-Kady

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal-substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model. © 2007 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	81-86
Number of pages	6
Journal	Photonics and Nanostructures - Fundamentals and Applications
Volume	6
Issue number	1
DOIs	https://doi.org/10.1016/j.photonics.2007.10.002
State	Published - Apr 1 2008
Externally published	Yes

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10.1016/j.photonics.2007.10.002

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title = "Emissivity measurements of 3D photonic crystals at high temperatures",

abstract = "An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal-substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4\% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model. {\textcopyright} 2007 Elsevier B.V. All rights reserved.",

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TY - JOUR

T1 - Emissivity measurements of 3D photonic crystals at high temperatures

AU - Luk, T. S.

AU - Mclellan, T.

AU - Subramania, G.

AU - Verley, J. C.

AU - El-Kady, I.

PY - 2008/4/1

Y1 - 2008/4/1

N2 - An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal-substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model. © 2007 Elsevier B.V. All rights reserved.

AB - An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal-substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model. © 2007 Elsevier B.V. All rights reserved.

UR - https://www.scopus.com/pages/publications/40749110140

U2 - 10.1016/j.photonics.2007.10.002

DO - 10.1016/j.photonics.2007.10.002

M3 - Article

SN - 1569-4410

VL - 6

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EP - 86

JO - Photonics and Nanostructures - Fundamentals and Applications

JF - Photonics and Nanostructures - Fundamentals and Applications

IS - 1

ER -

Emissivity measurements of 3D photonic crystals at high temperatures

Abstract

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