Abstract
Experimental quantification of the critical resolved shear stress (CRSS) at the level of unit dislocation glide is still a challenge. By using in situ nanoindentation in a high-resolution transmission electron microscope and strain analysis of the acquired structural images, the CRSS for the motion of individual dislocations on {110}011 slip system and glide dislocation re-emission from a tilt grain boundary in TiN are quantified. This work offers an approach to measure the local stresses associated with dislocation motion in high-strength materials.
| Original language | English |
|---|---|
| Pages (from-to) | 4434-4439 |
| Number of pages | 6 |
| Journal | Nano Letters |
| Volume | 15 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 8 2015 |
| Externally published | Yes |
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