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Fingerprinting f-electron compounds using static and time-resolved extreme ultraviolet reflectance spectroscopy

  • P. J. Skrodzki
  • , T. Buckway
  • , P. Padmanabhan
  • , S. M. Greer
  • , M. Y. Livshits
  • , R. Sandberg
  • , I. Robel
  • , B. Stein
  • , P. Bowlan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Extreme ultraviolet reflectance spectroscopy is a powerful tool for distinguishing similar f-electron compounds through the shape of O- and N-edge absorption features. We demonstrate this with two cerium compounds working towards measurements on actinides.

Original languageEnglish
Title of host publication2023 Conference on Lasers and Electro-Optics, CLEO 2023
PublisherUnknown Publisher
ISBN (Electronic)9781957171258
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics, CLEO 2023 -
Duration: Jan 1 2023 → …

Publication series

Name2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics, CLEO 2023
Period01/1/23 → …

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