@article{28d3d13732da46ae832e99d233b2d06c,
title = "Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM) for Advance Characterization of Grain Boundaries at the Nanoscale in Copper Bicrystals",
author = "Kucinski, \{Theresa M.\} and Dongyue Xie and Nan Li and Savitzky, \{Benjamin H.\} and Colin Ophus and Pettes, \{Michael T.\}",
year = "2024",
month = jul,
day = "24",
doi = "10.1093/mam/ozae044.146",
language = "English",
volume = "30",
pages = "322",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Oxford University Press",
number = "2024",
note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 24-07-2024",
}