Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy

V. K. Tewary; Rebecca C. Quardokus; Frank W. Delrio

doi:10.1016/j.physleta.2016.03.021

Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy

V. K. Tewary
, Rebecca C. Quardokus
, Frank W. Delrio

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

A Green's function (GF) method is developed for interpreting scanning probe microscopy (SPM) measurements on new two-dimensional (2D) materials. GFs for the Laplace/Poisson equations are calculated by using a virtual source method for two separate cases of a finite material containing a rectangular defect and a hexagonal defect. The prescribed boundary values are reproduced almost exactly by the calculated GFs. It is suggested that the GF is not just a mathematical artefact but a basic physical characteristic of material systems, which can be measured directly by SPM for 2D solids. This should make SPM an even more powerful technique for characterization of 2D materials.

Original language	English
Pages (from-to)	1750-1756
Number of pages	7
Journal	Physics Letters A
Volume	380
Issue number	20
DOIs	https://doi.org/10.1016/j.physleta.2016.03.021
State	Published - Apr 29 2016
Externally published	Yes

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title = "Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy",

abstract = "A Green's function (GF) method is developed for interpreting scanning probe microscopy (SPM) measurements on new two-dimensional (2D) materials. GFs for the Laplace/Poisson equations are calculated by using a virtual source method for two separate cases of a finite material containing a rectangular defect and a hexagonal defect. The prescribed boundary values are reproduced almost exactly by the calculated GFs. It is suggested that the GF is not just a mathematical artefact but a basic physical characteristic of material systems, which can be measured directly by SPM for 2D solids. This should make SPM an even more powerful technique for characterization of 2D materials.",

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T1 - Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy

AU - Tewary, V. K.

AU - Quardokus, Rebecca C.

AU - Delrio, Frank W.

PY - 2016/4/29

Y1 - 2016/4/29

N2 - A Green's function (GF) method is developed for interpreting scanning probe microscopy (SPM) measurements on new two-dimensional (2D) materials. GFs for the Laplace/Poisson equations are calculated by using a virtual source method for two separate cases of a finite material containing a rectangular defect and a hexagonal defect. The prescribed boundary values are reproduced almost exactly by the calculated GFs. It is suggested that the GF is not just a mathematical artefact but a basic physical characteristic of material systems, which can be measured directly by SPM for 2D solids. This should make SPM an even more powerful technique for characterization of 2D materials.

AB - A Green's function (GF) method is developed for interpreting scanning probe microscopy (SPM) measurements on new two-dimensional (2D) materials. GFs for the Laplace/Poisson equations are calculated by using a virtual source method for two separate cases of a finite material containing a rectangular defect and a hexagonal defect. The prescribed boundary values are reproduced almost exactly by the calculated GFs. It is suggested that the GF is not just a mathematical artefact but a basic physical characteristic of material systems, which can be measured directly by SPM for 2D solids. This should make SPM an even more powerful technique for characterization of 2D materials.

UR - https://www.scopus.com/pages/publications/84961779056

U2 - 10.1016/j.physleta.2016.03.021

DO - 10.1016/j.physleta.2016.03.021

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VL - 380

SP - 1750

EP - 1756

JO - Physics Letters A

JF - Physics Letters A

IS - 20

ER -

Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy

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