High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples

S. H. Chen; Z. Elgat; J. C. Barbour; L. R. Zheng; J. W. Mayer; C. B. Carter

doi:10.1016/0304-3991(85)90147-0

High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples

S. H. Chen
, Z. Elgat
, J. C. Barbour
, L. R. Zheng
, J. W. Mayer
, C. B. Carter

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

The microstructures of silicide Ni5Si2, which formed in self-supporting Ni-Si lateral-diffusion couples, have been studied using high-resolution electron microscopy. Two polytypes for Ni5Si2 have been observed and the actual composition of one polytype is confirmed to be Ni31Si12. Local variations of the crystal structure of Ni5Si2 are also observed and the results are compared to computer-simulated images. © 1985.

Original language	English
Pages (from-to)	297-303
Number of pages	7
Journal	Ultramicroscopy
Volume	18
Issue number	1-4
DOIs	https://doi.org/10.1016/0304-3991(85)90147-0
State	Published - Jan 1 1985
Externally published	Yes

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Cite this

@article{37b82b2a7c7b4256b3e3fd61cdaa5e93,

title = "High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples",

abstract = "The microstructures of silicide Ni5Si2, which formed in self-supporting Ni-Si lateral-diffusion couples, have been studied using high-resolution electron microscopy. Two polytypes for Ni5Si2 have been observed and the actual composition of one polytype is confirmed to be Ni31Si12. Local variations of the crystal structure of Ni5Si2 are also observed and the results are compared to computer-simulated images. {\textcopyright} 1985.",

author = "Chen, \{S. H.\} and Z. Elgat and Barbour, \{J. C.\} and Zheng, \{L. R.\} and Mayer, \{J. W.\} and Carter, \{C. B.\}",

year = "1985",

month = jan,

day = "1",

doi = "10.1016/0304-3991(85)90147-0",

language = "English",

volume = "18",

pages = "297--303",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "1-4",

}

TY - JOUR

T1 - High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples

AU - Chen, S. H.

AU - Elgat, Z.

AU - Barbour, J. C.

AU - Zheng, L. R.

AU - Mayer, J. W.

AU - Carter, C. B.

PY - 1985/1/1

Y1 - 1985/1/1

N2 - The microstructures of silicide Ni5Si2, which formed in self-supporting Ni-Si lateral-diffusion couples, have been studied using high-resolution electron microscopy. Two polytypes for Ni5Si2 have been observed and the actual composition of one polytype is confirmed to be Ni31Si12. Local variations of the crystal structure of Ni5Si2 are also observed and the results are compared to computer-simulated images. © 1985.

AB - The microstructures of silicide Ni5Si2, which formed in self-supporting Ni-Si lateral-diffusion couples, have been studied using high-resolution electron microscopy. Two polytypes for Ni5Si2 have been observed and the actual composition of one polytype is confirmed to be Ni31Si12. Local variations of the crystal structure of Ni5Si2 are also observed and the results are compared to computer-simulated images. © 1985.

UR - https://www.scopus.com/pages/publications/0022182297

U2 - 10.1016/0304-3991(85)90147-0

DO - 10.1016/0304-3991(85)90147-0

M3 - Article

SN - 0304-3991

VL - 18

SP - 297

EP - 303

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-4

ER -

High-resolution electron microscopy studies of Ni silicides formed in lateral diffusion couples

Abstract

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