Abstract
The properties of GaAs/AlGaAs quantum-well heterostructures have been investigated using transmission electron microscopy (TEM) together with photoluminescence. Modifications to the reactor are described which allow abrupt interfaces (∼5 Å) and strong optical emission to be obtained up to 300 K from single layers <40 Å thick. TEM and Raman scattering have been used to characterize heterostructures, which has resulted in an optimized gas handling system for precise control of reactant fluxes in a low-pressure apparatus. The effects of pressure transients, gas-flow recirculation, and residual aluminum incorporation in thin GaAs films grown over AlGaAs are presented.
| Original language | English |
|---|---|
| Pages (from-to) | 678-680 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 59 |
| Issue number | 2 |
| DOIs | |
| State | Published - Dec 1 1986 |
| Externally published | Yes |
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