Impurity elements study of carbon nanotubes fabricated by chemical vapor deposition

I. O. Usov; Y. Q. Wang; Q. Li; Y. T. Zhu; R. F. DePaula; P. N. Arendt

doi:10.1016/j.nimb.2007.04.173

Impurity elements study of carbon nanotubes fabricated by chemical vapor deposition

I. O. Usov
, Y. Q. Wang
, Q. Li
, Y. T. Zhu
, R. F. DePaula
, P. N. Arendt

Los Alamos National Laboratory

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

It is widely known that materials properties are very sensitive to the presence of impurity elements. In this study we performed Rutherford backscattering spectroscopy (RBS) and particle induced X-ray emission (PIXE) analysis of impurity elements in carbon nanotubes (CNTs) fabricated by chemical vapor deposition. Impurities such as O, Si, P, S, Cl, Ar, Ti, Cr and Fe were found. The O was uniformly distributed and the most abundant impurity in CNTs. Sources of contamination were investigated and it was suggested that the presence of Si, S, Cl, Ti and Cr can be eliminated.

Original language	English
Pages (from-to)	574-577
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	261
Issue number	1-2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.nimb.2007.04.173
State	Published - Aug 1 2007

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@article{3297775a725a41d1a9fdeed2a04eebf1,

title = "Impurity elements study of carbon nanotubes fabricated by chemical vapor deposition",

abstract = "It is widely known that materials properties are very sensitive to the presence of impurity elements. In this study we performed Rutherford backscattering spectroscopy (RBS) and particle induced X-ray emission (PIXE) analysis of impurity elements in carbon nanotubes (CNTs) fabricated by chemical vapor deposition. Impurities such as O, Si, P, S, Cl, Ar, Ti, Cr and Fe were found. The O was uniformly distributed and the most abundant impurity in CNTs. Sources of contamination were investigated and it was suggested that the presence of Si, S, Cl, Ti and Cr can be eliminated.",

author = "Usov, \{I. O.\} and Wang, \{Y. Q.\} and Q. Li and Zhu, \{Y. T.\} and DePaula, \{R. F.\} and Arendt, \{P. N.\}",

year = "2007",

month = aug,

day = "1",

doi = "10.1016/j.nimb.2007.04.173",

language = "English",

volume = "261",

pages = "574--577",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1-2 SPEC. ISS.",

}

TY - JOUR

T1 - Impurity elements study of carbon nanotubes fabricated by chemical vapor deposition

AU - Usov, I. O.

AU - Wang, Y. Q.

AU - Li, Q.

AU - Zhu, Y. T.

AU - DePaula, R. F.

AU - Arendt, P. N.

PY - 2007/8/1

Y1 - 2007/8/1

N2 - It is widely known that materials properties are very sensitive to the presence of impurity elements. In this study we performed Rutherford backscattering spectroscopy (RBS) and particle induced X-ray emission (PIXE) analysis of impurity elements in carbon nanotubes (CNTs) fabricated by chemical vapor deposition. Impurities such as O, Si, P, S, Cl, Ar, Ti, Cr and Fe were found. The O was uniformly distributed and the most abundant impurity in CNTs. Sources of contamination were investigated and it was suggested that the presence of Si, S, Cl, Ti and Cr can be eliminated.

AB - It is widely known that materials properties are very sensitive to the presence of impurity elements. In this study we performed Rutherford backscattering spectroscopy (RBS) and particle induced X-ray emission (PIXE) analysis of impurity elements in carbon nanotubes (CNTs) fabricated by chemical vapor deposition. Impurities such as O, Si, P, S, Cl, Ar, Ti, Cr and Fe were found. The O was uniformly distributed and the most abundant impurity in CNTs. Sources of contamination were investigated and it was suggested that the presence of Si, S, Cl, Ti and Cr can be eliminated.

UR - https://www.scopus.com/pages/publications/34447269960

U2 - 10.1016/j.nimb.2007.04.173

DO - 10.1016/j.nimb.2007.04.173

M3 - Article

SN - 0168-583X

VL - 261

SP - 574

EP - 577

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1-2 SPEC. ISS.

ER -

Impurity elements study of carbon nanotubes fabricated by chemical vapor deposition

Abstract

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