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In situ biasing of tapered Si-Ge nw heterojunctions using off-axis electron holography

  • Z. Gan
  • , D. Perea
  • , Y. He
  • , R. Colby
  • , M. Gu
  • , Y. Jinkyoung
  • , C. Wang
  • , S. T. Picraux
  • , D. J. Smith
  • , M. R. McCartney

Research output: Contribution to journalConference article

Original languageEnglish
Pages (from-to)256-257
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 -
Duration: Aug 1 2014 → …

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