In-Situ Gracing Incidence Wide Angle X-Ray Scattering for Hybrid Perovskite Semiconductors

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	A56-A56
Number of pages	1
Journal	Acta Crystallographica Section A: Foundations and Advances
Volume	75
DOIs	https://doi.org/10.1107/S0108767319099434
State	Published - 2019

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@article{572701e3f6904d4d933333b2c6e22898,

title = "In-Situ Gracing Incidence Wide Angle X-Ray Scattering for Hybrid Perovskite Semiconductors",

author = "Hsinhan Tsai and Cunming Liu and Aditya Mohite and Xiaoyi Zhang and Joseph Strzalka and Wanyi Nie",

year = "2019",

doi = "10.1107/S0108767319099434",

language = "English",

volume = "75",

pages = "A56--A56",

journal = "Acta Crystallographica Section A: Foundations and Advances",

issn = "2053-2733",

publisher = "John Wiley \& Sons Inc.",

}

TY - JOUR

T1 - In-Situ Gracing Incidence Wide Angle X-Ray Scattering for Hybrid Perovskite Semiconductors

AU - Tsai, Hsinhan

AU - Liu, Cunming

AU - Mohite, Aditya

AU - Zhang, Xiaoyi

AU - Strzalka, Joseph

AU - Nie, Wanyi

PY - 2019

Y1 - 2019

U2 - 10.1107/S0108767319099434

DO - 10.1107/S0108767319099434

M3 - Article

SN - 2053-2733

VL - 75

SP - A56-A56

JO - Acta Crystallographica Section A: Foundations and Advances

JF - Acta Crystallographica Section A: Foundations and Advances

ER -