Abstract
The structure of pressure-densified vitreous SiO2 has been investigated using neutron-diffraction and molecular-dynamics techniques. After compression to 16 GPa at room temperature, recovered samples have densities 20% higher than normal vitreous SiO2 and show substantial changes in the first sharp diffraction peak (FSDP): an indication of modification in the intermediate-range order. The changes in the FSDP are due to increased frustration caused by the decrease in the Si-O-Si bond angle and a shift in the Si-Si and O-O correlations in the range of 48 toward lower distances. © 1991 The American Physical Society.
| Original language | English |
|---|---|
| Pages (from-to) | 1194-1197 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 43 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1 1991 |
| Externally published | Yes |
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