Interpretation of HRTEM images of interfaces containing misfit dislocations lying parallel to the surface of the sample

An edge dislocation lying parallel to the surface of the foil and with the Burgers vector parallel to the electron beam is not usually expected to give rise to contrast in a high-resolution electron micrograph. In fact, such a dislocation does have a longrange effect on the image contrast of diffraction-contrast images (the g · b × u contrast). In the following computer simulation study, it is shown that such dislocations indeed may also have a considerable effect on high-resolution transmission electron microscopy images. The sensitivity of the image contrast to the position of the dislocation within the foil is discussed. © 1991 Taylor & Francis Group, LLC.