Abstract
Ion implantation has been shown to significantly alter the surface properties of polymers. The enhancement of these surface properties is attributed to the microstructural alteration of the polymers as a result of the ion beam treatment. To a great extent, the microstructure depends on the compositional constituents in the modified polymer layers. This article uses ion beam analysis techniques to study the atomic composition and their depth profiles for a set of carefully prepared polymer films implanted with 50 keV nitrogen ions. The results are discussed along with the electronic properties as well as the ion energy deposition mechanisms in polymer films.
| Original language | English |
|---|---|
| Pages (from-to) | 1027-1032 |
| Number of pages | 6 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 161 |
| DOIs | |
| State | Published - Jan 1 2000 |
| Externally published | Yes |
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