Abstract
Transmission and scanning electron microscopy have been used to characterize thin films of Fe oxide grown on (00l)-oriented MgO using pulsed-laser deposition. Several films, each with a longer deposition time, and hence increasing thickness, were grown under similar conditions of oxygen pressure, deposition rate and substrate temperature. For shorter deposition times, i.e. thinner films, a spinel-structured Fe oxide film occurred, while for longer deposition times a corundum-structured Fe oxide film formed. In some instances it was found that the film had a mixture of the two structures of Fe oxide. The analysis of these films determined that the corundum-structured Fe oxide was being formed via a transformation from the spinel structure. This transformation process led to interesting thin-film morphologies and epitactic alignments. © 1999 Taylor & Francis Ltd.
| Original language | English |
|---|---|
| Pages (from-to) | 2887-2898 |
| Number of pages | 12 |
| Journal | Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties |
| Volume | 79 |
| Issue number | 12 |
| DOIs | |
| State | Published - Jan 1 1999 |
| Externally published | Yes |
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