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Lattice Constant Statistical Analysis with 4D-STEM: A Case Study of Point Defects in Cr Under Varied Temperature and Irradiation

  • Dongye Liu
  • , Sean H. Mills
  • , Benjamin K. Derby
  • , Matthew R. Chancey
  • , Kayla Yano
  • , Yongqiang Wang
  • , Andrew M. Minor

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)1887-1888
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 -
Duration: Jul 24 2024 → …

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