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Measuring the thermal conductivity of porous, transparent SiO<inf>2</inf> films with time domain thermoreflectance

  • Patrick E. Hopkins
  • , Bryan Kaehr
  • , Leslie M. Phinney
  • , Timothy P. Koehler
  • , Anne M. Grillet
  • , Darren Dunphy
  • , Fred Garcia
  • , C. Jeffrey Brinker

Research output: Contribution to journalArticlepeer-review

62 Scopus citations

Abstract

Nanocomposites offer unique capabilities of controlling thermal transport through the manipulation of various structural aspects of the material. However, measurements of the thermal properties of these composites are often difficult, especially porous nanomaterials. Optical measurements of these properties, although ideal due to the noncontact nature, are challenging due to the large surface variability of nanoporous structures. In this work, we use a vector-based thermal algorithm to solve for the temperature change and heat transfer in which a thin film subjected to a modulated heat source is sandwiched between two thermally conductive pathways. We validate our solution with time domain thermoreflectance measurements on glass slides and extend the thermal conductivity measurements to SiO2 -based nanostructured films. © 2011 American Society of Mechanical Engineers.
Original languageEnglish
JournalJournal of Heat Transfer
Volume133
Issue number6
DOIs
StatePublished - Mar 18 2011
Externally publishedYes

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