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Mid-infrared amplitude and phase measurement of metamaterials using tandem interferometry

  • B. S. Passmore
  • , J. Anderson
  • , G. A. Ten Eyck
  • , J. R. Wendt
  • , I. Brener
  • , M. B. Sinclair
  • , E. A. Shaner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A tandem interferometer system measuring the absolute phase and amplitude of planar split-ring resonators fabricated on a BaF2 substrate with a designed resonance at 10.5 μm is presented. © 2010 Optical Society of America.
Original languageEnglish
Title of host publicationOptics InfoBase Conference Papers
StatePublished - Dec 1 2010
Externally publishedYes

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