Abstract
A tandem interferometer system measuring the absolute phase and amplitude of planar split-ring resonators fabricated on a BaF2 substrate with a designed resonance at 10.5 μm is presented. © 2010 Optical Society of America.
| Original language | English |
|---|---|
| Title of host publication | Optics InfoBase Conference Papers |
| State | Published - Dec 1 2010 |
| Externally published | Yes |
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