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Model for ratchet growth in PBX 9502

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

We developed a statistical model for RG. The model attributes RG to the formation of intergranular cracks caused by tessellated internal stresses that develop during the thermal excursions. It is postulated that different sets of internal cracks form upon heating and cooling the polycrystalline solid. The model reproduces RG measurements in pressed TATB and PBX 9502 energetic materials and suggests an explanation for why the amplitude of RG generated by a heating excursion is larger than that generated by a subsequent cooling excursion of the same amplitude.
Original languageEnglish
Pages (from-to)170-179
Number of pages10
JournalActa Materialia
Volume180
DOIs
StatePublished - Nov 1 2019

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