Abstract
We use photoemission electron microscopy for hyperspectral imaging of electromagnetic field localization in broken-symmetry III-V semiconductor metasurfaces with high selectivity to characterize complex resonant mode profiles, determine coherent interaction lengths, and corroborate FDTD simulations.
| Original language | English |
|---|---|
| Title of host publication | 2023 Conference on Lasers and Electro-Optics, CLEO 2023 |
| State | Published - Jan 1 2023 |
| Externally published | Yes |
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