Abstract
High-quality 100 nm thin films of NiO were grown on single-crystal (0001) α-Al2O3 substrates by pulsed-laser ablation. The resultant microstructure consists of two twin variants such that the (111) plane in both NiO twins is parallel to the basal (0001) plane of α-Al2O3. They differ by a rotation of 60 or 180° about the [0001] axis. Furthermore, the microstructure of those twins can be made to conform to the underlying substrate steps with the result being twin grains on the order of 200-400 nm wide and many tens of microns long. Scanning and transmission electron microscopy studies were performed to determine the mechanism and kinetics of the solid state reaction.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Pages | 520-521 |
| Number of pages | 2 |
| State | Published - Dec 1 1994 |
| Externally published | Yes |
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