Skip to main navigation Skip to search Skip to main content

Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy

  • Christopher R. Perrey
  • , Julia M. Deneen
  • , Siri S. Thompson
  • , Markus Lentzen
  • , Uwe Kortshagen
  • , C. Barry Carter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis
Pages996-997
Number of pages2
Volume10
EditionSUPPL. 2
DOIs
StatePublished - Sep 24 2004
Externally publishedYes

Cite this