Observation of solid-state reaction between a thin yttria film and a (0001) α-alumina substrate

Jason R. Heffelfinger; C. Barry Carter

Observation of solid-state reaction between a thin yttria film and a (0001) α-alumina substrate

Jason R. Heffelfinger
, C. Barry Carter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Transmission electron microscopy (TEM), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) were used to investigate the solid-state reaction between a thin yttria film and a (0001) α-alumina substrate. Systems containing Y2O3 (yttria) and Al2O3 (alumina) are seen in many technologically relevant applications.

Original language	English
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Pages	644-665
Number of pages	22
State	Published - Dec 1 1994
Externally published	Yes

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title = "Observation of solid-state reaction between a thin yttria film and a (0001) α-alumina substrate",

abstract = "Transmission electron microscopy (TEM), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) were used to investigate the solid-state reaction between a thin yttria film and a (0001) α-alumina substrate. Systems containing Y2O3 (yttria) and Al2O3 (alumina) are seen in many technologically relevant applications.",

author = "Heffelfinger, \{Jason R.\} and Carter, \{C. Barry\}",

year = "1994",

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language = "English",

pages = "644--665",

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T1 - Observation of solid-state reaction between a thin yttria film and a (0001) α-alumina substrate

AU - Heffelfinger, Jason R.

AU - Carter, C. Barry

PY - 1994/12/1

Y1 - 1994/12/1

N2 - Transmission electron microscopy (TEM), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) were used to investigate the solid-state reaction between a thin yttria film and a (0001) α-alumina substrate. Systems containing Y2O3 (yttria) and Al2O3 (alumina) are seen in many technologically relevant applications.

AB - Transmission electron microscopy (TEM), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) were used to investigate the solid-state reaction between a thin yttria film and a (0001) α-alumina substrate. Systems containing Y2O3 (yttria) and Al2O3 (alumina) are seen in many technologically relevant applications.

UR - https://www.scopus.com/pages/publications/0028749393

M3 - Conference contribution

SP - 644

EP - 665

BT - Proceedings - Annual Meeting, Microscopy Society of America

ER -

Observation of solid-state reaction between a thin yttria film and a (0001) α-alumina substrate

Abstract

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