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Observations of constrictions on dissociated dislocation lines in copper alloys

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

The weak-beam technique of electron microscopy (Cockayne, Ray and Whelan 1969) has been used to study constrictions found on extended dislocation lines in a copper-silicon alloy. The nature of these constrictions has been determined using in situ heating of the alloy. © 1974, Taylor & Francis Group, LLC. All rights reserved.
Original languageEnglish
Pages (from-to)1231-1235
Number of pages5
JournalPhilosophical Magazine
Volume29
Issue number5
DOIs
StatePublished - Jan 1 1974
Externally publishedYes

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