Abstract
The weak-beam technique of electron microscopy (Cockayne, Ray and Whelan 1969) has been used to study constrictions found on extended dislocation lines in a copper-silicon alloy. The nature of these constrictions has been determined using in situ heating of the alloy. © 1974, Taylor & Francis Group, LLC. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 1231-1235 |
| Number of pages | 5 |
| Journal | Philosophical Magazine |
| Volume | 29 |
| Issue number | 5 |
| DOIs | |
| State | Published - Jan 1 1974 |
| Externally published | Yes |
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