Abstract
Ion implantation of xenon into single-crystal magnesium oxide results in the formation of solid, crystalline xenon inclusions. These inclusions have been investigated by transmission electron microscopy and selected-area diffraction. The solid inclusions could be divided into two categories: those that were epitactically aligned with the matrix and those that were randomly oriented. The formation of solid inclusions at room temperature indicates that they were under a high pressure. This pressure was calculated to be 0.40.6 GPa. © 1991 The American Physical Society.
| Original language | English |
|---|---|
| Pages (from-to) | 9291-9294 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 43 |
| Issue number | 11 |
| DOIs | |
| State | Published - Jan 1 1991 |
| Externally published | Yes |
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