On the Fresnel-fringe technique for the analysis of interfacial films

D. René Rasmussen; C. Barry Carter

doi:10.1016/0304-3991(90)90080-6

On the Fresnel-fringe technique for the analysis of interfacial films

D. René Rasmussen
, C. Barry Carter

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

A critical examination of the Fresnel-fringe technique for the analysis of interfaces particularly with respect to the detection and characterization of interfacial films is presented. The sensitivity of the fringe spacing to specimen artifacts is investigated, and the dependency on the diffuseness of the interface potential is analyzed. Several different methods for estimating the characteristics of the interface are then presented and compared. © 1990.

Original language	English
Pages (from-to)	337-348
Number of pages	12
Journal	Ultramicroscopy
Volume	32
Issue number	4
DOIs	https://doi.org/10.1016/0304-3991(90)90080-6
State	Published - Jan 1 1990
Externally published	Yes

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title = "On the Fresnel-fringe technique for the analysis of interfacial films",

abstract = "A critical examination of the Fresnel-fringe technique for the analysis of interfaces particularly with respect to the detection and characterization of interfacial films is presented. The sensitivity of the fringe spacing to specimen artifacts is investigated, and the dependency on the diffuseness of the interface potential is analyzed. Several different methods for estimating the characteristics of the interface are then presented and compared. {\textcopyright} 1990.",

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AU - Carter, C. Barry

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N2 - A critical examination of the Fresnel-fringe technique for the analysis of interfaces particularly with respect to the detection and characterization of interfacial films is presented. The sensitivity of the fringe spacing to specimen artifacts is investigated, and the dependency on the diffuseness of the interface potential is analyzed. Several different methods for estimating the characteristics of the interface are then presented and compared. © 1990.

AB - A critical examination of the Fresnel-fringe technique for the analysis of interfaces particularly with respect to the detection and characterization of interfacial films is presented. The sensitivity of the fringe spacing to specimen artifacts is investigated, and the dependency on the diffuseness of the interface potential is analyzed. Several different methods for estimating the characteristics of the interface are then presented and compared. © 1990.

UR - https://www.scopus.com/pages/publications/0025423381

U2 - 10.1016/0304-3991(90)90080-6

DO - 10.1016/0304-3991(90)90080-6

M3 - Article

SN - 0304-3991

VL - 32

SP - 337

EP - 348

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 4

ER -

On the Fresnel-fringe technique for the analysis of interfacial films

Abstract

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