Abstract
CuO nanocrystalline thin films are deposited on quartz substrates by pulsed laser deposition. The grown single-phase CuO films are characterized by X-ray diffraction, X-ray photoelectron spectrometer and transmission electron microscopy. The optical nonlinearity of CuO films is investigated by the Z-scan method under a high-repetition-rate (HRR) femtosecond laser (800 nm, 50 fs, 80 MHz). The CuO nanocrystalline films are found to be good optical limiters with a limiting threshold of 0.3 GW/cm2 and a damage threshold of 1.65 GW/cm2. The possible mechanisms of the optical limiting are also proposed.
| Original language | English |
|---|---|
| Pages (from-to) | 319-322 |
| Number of pages | 4 |
| Journal | Materials Letters |
| Volume | 91 |
| DOIs | |
| State | Published - Jan 15 2013 |
| Externally published | Yes |
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