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Optimisation of 635 nm tensile strained GaInP laser diodes

  • P. M. Smowton
  • , G. M. Lewis
  • , W. W. Chow
  • , G. Jones
  • , S. Bland

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The affect of the strain on all of the recombination mechanisms which make up the total threshold current within 635nm laser diodes was measured with a range of strain-well width combinations. Non-radiative recombination within the quantum well is an important proportion of the total threshold current and it also determines the optimum strain-well width combination. The influence of strain on the operation of a laser was determined by its effect on the optical gain and the spontaneous recombination rates associated with the TE and TM polarization modes.
Original languageEnglish
Title of host publicationConference Digest - IEEE International Semiconductor Laser Conference
Pages127-128
Number of pages2
StatePublished - Jan 1 2002
Externally publishedYes

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